INTERACTION OF ATOMIC AND MOLECULAR MEV IONS WITH SURFACE Conference Paper uri icon

abstract

  • Secondary ion emission was studied using atomic and molecular ions bombarding organic and metallic targets. The energy of the projectile ions varied from 200 keV to 3 MeV. Relative yields of positive and negative secondary ions desorbed from phenylalanine and aluminum targets were identified by time-of-flight mass spectrometry. Cq+, Oq+, Nq+, CO+ and CO2+ (0 q 7) were the beams used in this study. The yield obtained for [M-H]-, [M + H]+ and H- and H+ secondary ions indicate the existence of two mechanisms for the desorption process: the kinetic and the surface mechanism. 1993.

published proceedings

  • NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

author list (cited authors)

  • LEITE, C., BAPTISTA, G. B., PINHO, R. R., DASILVEIRA, E. F., JERONYMO, J., & SCHWEIKERT, E. A.

citation count

  • 2

complete list of authors

  • LEITE, CVB||BAPTISTA, GB||PINHO, RR||DASILVEIRA, EF||JERONYMO, JMF||SCHWEIKERT, EA

publication date

  • June 1993