Secondary-ion emission from phenylalanine induced by atomic and molecular MeV ion beams. Academic Article uri icon

abstract

  • Relative yields of positive and negative secondary ions are measured for atomic and molecular MeV ion beam impinging on a phenylalanine target. The secondary ions were identified by a time-of-flight mass spectrometer. C+, O+, CO+, and CO2+ were the beams used. The yields obtained for [M-H]-, [M+H]+, and [M-COOH]+ secondary ions show that they are roughly proportional to the third power of the beam stopping power. Other experimental results and predictions of the molecular-expansion model for neutral ejected species are included in the discussion. 1992 The American Physical Society.

published proceedings

  • Phys Rev B Condens Matter

author list (cited authors)

  • Barros Leite CV, .., da Silveira EF, .., Jeronymo, J. M., Pinho, R. R., Baptista, G. B., Schweikert, E. A., & Park, M. A.

citation count

  • 13

complete list of authors

  • Jeronymo, JM||Pinho, RR||Baptista, GB||Schweikert, EA||Park, MA

publication date

  • June 1992