Secondary ion mass spectrometry with C-60(+) and Au-400(4+) projectiles: Depth and nature of secondary ion emission from multilayer assemblies Academic Article uri icon


  • Alternating nanometric thin layer films made from poly(diallyldimethylammonium chloride), poly(styrene sulfonate) and montmorillonite clay were analyzed with 26 keV C60+ (433 eV/atom) and 136 keV Au4004+ (340 eV/atom). Secondary ion (SI) emission depth from such thin films was determined to be 6-9 nm with C60+ bombardment. Similar depth of emission was also reported with Au4004+ projectile impacts [Z. Li, S.V. Verkhoturov, E.A. Schweikert, Anal. Chem. 78 (2006) 7410]. The SI spectra contain recoiled C60 projectile constituents (m/z = 12, 13, 36). They track the compositional variation of the assembled thin layers except for C- and CH- whose abundances appear to correlate with the presence of metal atoms in the topmost layer. 2007 Elsevier B.V. All rights reserved.

published proceedings


author list (cited authors)

  • Li, Z., Verkhoturov, S. V., Locklear, J. E., & Schweikert, E. A.

citation count

  • 23

complete list of authors

  • Li, Zhen||Verkhoturov, Stanislav V||Locklear, Jay E||Schweikert, Emile A

publication date

  • January 2008