Structural characterization of silicon orthophosphate Academic Article uri icon

abstract

  • Silicon phosphate samples have been synthesized at low temperature (200-300 °C) and characterized using various physico-chemical methods. The crystal structure of the silicon phosphate prepared at low temperature and the sample heated at 1000 °C was studied by the Rietveld method. The crystals belong to the hexagonal space group R3 with a {reversed tilde equals} 7.8 and c {reversed tilde equals} 24.0 Å. The structure of silicon phosphate in both of these samples is found to be Si5O(PO4)6. The asymmetric unit consist of three crystallographically independent silicon atoms of which one is in a tetrahedral environment and the other two have octahedral coordination. © 1993.

altmetric score

  • 6

author list (cited authors)

  • Poojary, D. M., Borade, R. B., & Clearfield, A.

citation count

  • 26

publication date

  • June 1993