STRUCTURAL CHARACTERIZATION OF SILICON ORTHOPHOSPHATE Academic Article uri icon

abstract

  • Silicon phosphate samples have been synthesized at low temperature (200-300 C) and characterized using various physico-chemical methods. The crystal structure of the silicon phosphate prepared at low temperature and the sample heated at 1000 C was studied by the Rietveld method. The crystals belong to the hexagonal space group R3 with a {reversed tilde equals} 7.8 and c {reversed tilde equals} 24.0 . The structure of silicon phosphate in both of these samples is found to be Si5O(PO4)6. The asymmetric unit consist of three crystallographically independent silicon atoms of which one is in a tetrahedral environment and the other two have octahedral coordination. 1993.

published proceedings

  • INORGANICA CHIMICA ACTA

altmetric score

  • 6

author list (cited authors)

  • POOJARY, D. M., BORADE, R. B., & CLEARFIELD, A.

citation count

  • 30

complete list of authors

  • POOJARY, DM||BORADE, RB||CLEARFIELD, A

publication date

  • June 1993