X-ray powder diffraction characterization of the elusive tetraphosphine Si(CH2PPh2)(4) silane

abstract

• X-ray powder diffraction data for the tetraphosphinic Si(CH2PPh2)4 silane are reported. Its crystal and molecular structures were determined by simulated annealing and full-profile Rietveld refinement methods. Si(CH2PPh2)4 was found to have tetragonal symmetry with P-421c space group. The lattice parameters were determined to be a=17.211(2) , c=7.553(1) , V=2237.5(5) 3. The crystal structure was found to contain isolated Si(CH2PPh2)4 molecules. In each Si(CH2PPh2)4 molecule, the central Si atom was fixed at the 4 symmetric position bearing four CH2PPh2 branches. This environment was confirmed by 31P CP/MAS NMR measurements. Thermo-diffractometric measurements in the 20120 C range were also used to estimate the linear and volumetric thermal expansion coefficients ( lnV/T=1.8104 K1), typical for very soft materials.

authors

• Bluemel, Janet

published proceedings

• POWDER DIFFRACTION

author list (cited authors)

• Masciocchi, N., Galli, S., Bogza, M., & Bluemel, J.

citation count

• 6

complete list of authors

• Masciocchi, Norberto||Galli, Simona||Bogza, Mona||Bluemel, Janet

publication date

• January 2007

publisher

• Cambridge University Press (CUP)  Publisher

published in

• Powder Diffraction  Journal

keywords

• Phosphine
• Powder Diffraction
• Rietveld Refinement
• Silane

Digital Object Identifier (DOI)

• 10.1154/1.2424476

start page

• 55

end page

• 58

volume

• 22

issue

• 1

URL

• http%3A%2F%2Fdx.doi.org%2F10.1154%2F1.2424476