Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 2. Investigation of Sputter-Induced Topography, Chemical Damage, and Depolymerization Effects Academic Article uri icon

author list (cited authors)

  • Mahoney, C. M., Fahey, A. J., Gillen, G., Xu, C., & Batteas, J. D.

publication date

  • January 1, 2006 11:11 AM