Scanned probe microscopy-medialed patterning of metallic nanostructures Academic Article

abstract

• Engineering sub-100 nm features on surfaces is of increasing importance for the development of new device technologies. To this end, researchers are developing scanned probe based approaches for the patterning of nanoscale metallic structures on surfaces. 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

authors

• Batteas, James

published proceedings

• ADVANCED ENGINEERING MATERIALS

author list (cited authors)

• Teague, L. C., & Batteas, J. D.

citation count

• 3

complete list of authors

• Teague, LC||Batteas, JD

publication date

• September 2005

publisher

• Wiley  Publisher

published in

• Advanced Engineering Materials  Journal

Digital Object Identifier (DOI)

• 10.1002/adem.200500085

start page

• 811

end page

• 814

volume

• 7

issue

• 9

URL

• http%3A%2F%2Fdx.doi.org%2F10.1002%2Fadem.200500085