Scanned Probe Microscopy‐Mediated Patterning of Metallic Nanostructures Academic Article uri icon

abstract

  • Engineering sub-100 nm features on surfaces is of increasing importance for the development of new device technologies. To this end, researchers are developing scanned probe based approaches for the patterning of nanoscale metallic structures on surfaces. © 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

author list (cited authors)

  • Teague, L. C., & Batteas, J. D.

citation count

  • 2

publication date

  • September 2005

publisher