Critical assessment of scratch visibility determination methodologies Conference Paper

abstract

• The major objective of this work is to critically assess the similarity and differences between the two industrial scratch visibility determination methodologies: Erichsen and ASTM/ISO scratch tests. The assessment relies on the two evaluation methodologies: L for Erichsen and contrast for ASTM/ISO. A good correlation between the two methods can only be established if a contrast criterion is also utilized for the Erichsen test. The surface deformation that gives rise to light scattering such as the scratch profile and the surface roughness on the scratch path were studied for both methods and their implication on scratch visibility will be discussed.

authors

• Sue, Hung-Jue

published proceedings

• Annual Technical Conference - ANTEC, Conference Proceedings

author list (cited authors)

• Liu, P., Browning, R. L., Sue, H. J., Li, J., Jones, S., & Traugott, T.

complete list of authors

• Liu, P||Browning, RL||Sue, HJ||Li, J||Jones, S||Traugott, T

publication date

• August 2011

International Standard Book Number (ISBN) 13

• 9781617829604

start page

• 940

end page

• 944

volume

• 1