An Eddy-Current Decay Technique for Low-Temperature Resistivity Measurements
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abstract
The eddy-current decay technique developed by Bean for restivity determination is well suited for material characterization studies. The technique is shown to be an excellent method for determining the terminal solid-solution phase boundary in aluminum-gold (Al-Au), for following age hardening in dilute Al-Au alloys, and for detecting anisotropic electrical resistivity in cold-worked aluminum. Rapid and highly accurate restivities are measured with a basic circuit arrangement incorporating a digital oscilloscope.
