Early science commissioning results of the sub-micron resolution X-ray spectroscopy beamline (SRX) in the field of materials science and engineering Conference Paper uri icon

abstract

  • © 2016 Author(s). Beamline commissioning activities at the Sub-micron Resolution Spectroscopy Beamline, SRX, one of the project beamlines of the National Synchrotron Light Source II, began in December 2014. SRX is a hard x-ray micro-probe beamline. The technical capabilities presented in this paper include scanning micro-fluorescence microscopy (μ-XRF) and x-ray absorption near-edge structure (μ-XANES) spectroscopy. The high flux KBs station with sub-micron resolution in the step-scanning mode has been commissioned with results presented in this paper. Capabilities under commissioning/planning include XRF-XANES stack imaging, a high resolution station (sub-100 nm), x-ray fluorescence tomography, integration of Maia detector, and fly-scan mode. Early science commissioning results from SRX in the materials science field are presented in this paper. Topics being studied include nanoporous materials for energy conversion/storage, thin film materials for electronics, degradation of paint materials for art conservation, and grain boundary segregation in structural materials. On December 7th 2015, SRX officially became a user-operational beamline and started accepting general users. The users of interest are encouraged to contact the beamline staff and submit General User Proposals.

author list (cited authors)

  • Chen-Wiegart, Y., Williams, G., Zhao, C., Jiang, H., Li, L. i., Demkowicz, M., ... Thieme, J.

publication date

  • January 1, 2016 11:11 AM