Early Science Commissioning Results of the Sub-micron Resolution X-ray Spectroscopy Beamline (SRX) in the Field of Materials Science and Engineering Conference Paper uri icon


  • 2016 Author(s). Beamline commissioning activities at the Sub-micron Resolution Spectroscopy Beamline, SRX, one of the project beamlines of the National Synchrotron Light Source II, began in December 2014. SRX is a hard x-ray micro-probe beamline. The technical capabilities presented in this paper include scanning micro-fluorescence microscopy (-XRF) and x-ray absorption near-edge structure (-XANES) spectroscopy. The high flux KBs station with sub-micron resolution in the step-scanning mode has been commissioned with results presented in this paper. Capabilities under commissioning/planning include XRF-XANES stack imaging, a high resolution station (sub-100 nm), x-ray fluorescence tomography, integration of Maia detector, and fly-scan mode. Early science commissioning results from SRX in the materials science field are presented in this paper. Topics being studied include nanoporous materials for energy conversion/storage, thin film materials for electronics, degradation of paint materials for art conservation, and grain boundary segregation in structural materials. On December 7th 2015, SRX officially became a user-operational beamline and started accepting general users. The users of interest are encouraged to contact the beamline staff and submit General User Proposals.

name of conference

  • ICXOM23: International Conference on X-ray Optics and Microanalysis

published proceedings


author list (cited authors)

  • Chen-Wiegart, Y., Williams, G., Zhao, C., Jiang, H., Li, L. i., Demkowicz, M., ... Thieme, J.

citation count

  • 15

complete list of authors

  • Chen-Wiegart, Yu-chen Karen||Williams, Garth||Zhao, Chonghang||Jiang, Hua||Li, Li||Demkowicz, Michael||Seita, Matteo||Short, Mike||Ferry, Sara||Wada, Takeshi||Kato, Hidemi||Chou, Kang Wei||Petrash, Stanislas||Catalano, Jaclyn||Yao, Yao||Murphy, Anna||Zumbulyadis, Nicholas||Centeno, Silvia A||Dybowski, Cecil||Thieme, Juergen

publication date

  • August 2016