Influence of interface sink strength on the reduction of radiation-induced defect concentrations and fluxes in materials with large interface area per unit volume Academic Article uri icon

abstract

  • We use a reaction-diffusion model to demonstrate that buried interfaces in polycrystalline composites simultaneously reduce both the concentrations and the fluxes of radiation-induced defects. The steady-state radiation-induced defect concentrations, however, are highly sensitive to the interface sink strength η. Materials containing a large volume fraction of interfaces may therefore be resistant to multiple forms of radiation-induced degradation, such as swelling and hardening, as well as to embrittlement by solute segregation, provided that the interfaces have suitable η values. © 2011 American Physical Society.

author list (cited authors)

  • Demkowicz, M. J., Hoagland, R. G., Uberuaga, B. P., & Misra, A.

citation count

  • 60

publication date

  • September 2011