Bayesian inference of substrate properties from film behavior Academic Article

abstract

• 2015 IOP Publishing Ltd. We demonstrate that by observing the behavior of a film deposited on a substrate, certain features of the substrate may be inferred with quantified uncertainty using Bayesian methods. We carry out this demonstration on an illustrative film/substrate model where the substrate is a Gaussian random field and the film is a two-component mixture that obeys the Cahn-Hilliard equation. We construct a stochastic reduced order model to describe the film/substrate interaction and use it to infer substrate properties from film behavior. This quantitative inference strategy may be adapted to other film/substrate systems.

authors

• Demkowicz, Michal

published proceedings

• Modelling and Simulation in Materials Science and Engineering

author list (cited authors)

• Aggarwal, R., Demkowicz, M. J., & Marzouk, Y. M.

citation count

• 9

complete list of authors

• Aggarwal, R||Demkowicz, MJ||Marzouk, YM

publication date

• January 2015

publisher

• IOP Publishing  Publisher

keywords

• 40 Engineering
• 4016 Materials Engineering
• 4017 Mechanical Engineering

Digital Object Identifier (DOI)

• 10.1088/0965-0393/23/1/015009

start page

• 015009

end page

• 015009

volume

• 23

issue

• 1

URL

• http%3A%2F%2Fdx.doi.org%2F10.1088%2F0965-0393%2F23%2F1%2F015009