Bayesian inference of substrate properties from film behavior Academic Article uri icon


  • 2015 IOP Publishing Ltd. We demonstrate that by observing the behavior of a film deposited on a substrate, certain features of the substrate may be inferred with quantified uncertainty using Bayesian methods. We carry out this demonstration on an illustrative film/substrate model where the substrate is a Gaussian random field and the film is a two-component mixture that obeys the Cahn-Hilliard equation. We construct a stochastic reduced order model to describe the film/substrate interaction and use it to infer substrate properties from film behavior. This quantitative inference strategy may be adapted to other film/substrate systems.

published proceedings

  • Modelling and Simulation in Materials Science and Engineering

author list (cited authors)

  • Aggarwal, R., Demkowicz, M. J., & Marzouk, Y. M.

citation count

  • 9

complete list of authors

  • Aggarwal, R||Demkowicz, MJ||Marzouk, YM

publication date

  • December 2014