Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting Conference Paper uri icon

abstract

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 August 7, 2008

published proceedings

  • Microscopy and Microanalysis

author list (cited authors)

  • Diercks, D. R., Kaufman, M. J., & Needleman, A.

publication date

  • January 1, 2008 11:11 AM