Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting Conference Paper uri icon

abstract

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

author list (cited authors)

  • Diercks, .., Kaufman, M. J., & Needleman, A.

citation count

  • 0

publication date

  • August 2008