Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting Conference Paper

abstract

• Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 August 7, 2008

authors

• Needleman, Alan

published proceedings

• Microscopy and Microanalysis

author list (cited authors)

• Diercks, .., Kaufman, M. J., & Needleman, A.

citation count

• 0

complete list of authors

• Kaufman, MJ||Needleman, A

publication date

• January 2008

publisher

• Oxford University Press (OUP)  Publisher

published in

• Microscopy and Microanalysis  Journal

Digital Object Identifier (DOI)

• 10.1017/s1431927608086923

start page

• 850

end page

• 851

volume

• 14

issue

• S2

URL

• http%3A%2F%2Fdx.doi.org%2F10.1017%2Fs1431927608086923